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New Product – Sol™ 2.5: TE Cooled InGaAs Array NIR Spectrometer

sol2.The Sol 2.5 (BTC263E) is B&W Tek’s exciting new product for a verity of NIR applications. This spectrometer covers 1700nm - 2500nm and features our newest enhanced TE Cooling and low noise readout electronics for longer integration times. With its high performance you can expect high sensitivity and high dynamic ranges for your long wavelength NIR applications such as composition analysis, moisture content and many more. The Sol 2.5, as well as all of our spectrometer line products, is customizable for any variety of OEM applications.

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Product Enhancement – Quest™ X CCD Spectrometer
Cylindrical Lens Option Now Available

quest Quest™Xis a low cost, high performance CCD spectrometer designed for UV-Vis-NIR applications with resolutions of 0.5 - 20 nm, depending on your configuration. Quest™ X employs a high speed USB 2.0 interface, a low stray light optical bench and an external trigger input. B&W Tek, Inc. is proud to announce Quest™ X has been enhanced to accommodate an optional cylindrical lens which provides a threefold increase in the spectral signal for a given integration time. With new dimensions of 102 x 67 x 34 mm, Quest™ X is bigger, better and brighter!

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SDK (Software Development Kit) Price Reduction!

Effective August 20, 2009 B&W Tek, Inc. has reduced the price of its SDK (Software Development Kit) packages by 60%. Our SDK provides the user with the detailed Function Calls for our .DLL files. This package is designed for customers who wish to create their own custom software interface allowing complete control over their spectrometer or system. The SDK package comes complete with simple programming examples using various spectrometers models to help you get up and running. The SDK is compatible with C#, C++ Builder 6, Visual C++ 6.0, Visual Basic 6.0, VBA, Labview, VB.NET.

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B&W Tek Raman products on Japanese TV!

scOn Saturday July 18, 2009 the Japanese TV program, Sekaiichi Uketai Jyugyou, featured B&W Tek’s portable Raman spectroscopy system, the MiniRam™ II. The host demonstrated how valuable a tool the MiniRam™ II can be in forensic studies, especially in cases where in situ material inspection is used to aid in solving crime. MiniRam™ II is a low cost, lightweight battery operated Raman spectroscopy instrument. It employs patented CleanLaze® 785 nm spectrum stabilized laser technology, providing a 10 cm-1 spectral resolution over a 175 - 3150 cm-1 Raman shift range. By using a fiber coupled sampling probe and integrated handtop PC, a user can collect Raman spectra of solids and liquids at the scene of crime where the information is most useful.

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B&W Tek has a new distributor in UK!
Starting from April 2009, Lambda Photometrics, Ltd. is B&W Tek's new distributor for the UK and Ireland. Founded in 1977, Lambda Photometrics is one of the UK’s leading distributors of photonic products and representative for over 40 world-class manufacturers. Lambda Photometrics is authorized to sell/distribute all of B&W Tek's products including Spectrometers, Raman Systems and Accessories, etc. We look forward to this new business relationship with Lambda Photometrics, Ltd. which will benefit all of our UK and Ireland based customers. Lambda Photometrics may be contacted at:


Lambda Photometrics Ltd.
Lambda House
Batford Mill, Harpenden
Herts - AL5 5BZ
Phone: +44 (0) 1582 764334
Fax: +44 (0) 1582 712084
Email: contact@lambdaphoto.co.uk
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B&W Tek and ST Japan Collaboration!
B&W Tek, Inc. and S. T. Japan, Inc. have entered into a distribution agreement on the Raman Libraries of S.T. Japan Inc. Under this agreement, these Raman Libraries will be incorporated into B&W Tek’s Raman Material Identification software: BWID, which can rapidly identify/verify materials at the time of acquisition or post process. Over 18,000 Raman spectra include polymers, solvents, pharmaceuticals, biochemicals, food additives, forensic materials and many more. The combination of BWID and any of B&W Tek's Raman Systems create a powerful and effective solution for identification and verification of materials.
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